Technology:
ICP - RIE
Cl based process
PR mask hard baked
Results:
Etch rate > 0.25 µm/min (total)
Uniformity < ± 4 % on 2” wafer
Selectivity > 8:1 to PR mask (total)
Profile control: vertical > 80°
Inductive Coupled Remote Plasma
 |
Plasmalab 80 Plus with cover for the ICP65 |
Plasmalab System 100: (cluster with ICP and RIE) |