
Plasmalab System 100 with ICP380
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ICP Source Design: ESS
All OPT ICP and RF sources are designed
with an electrostatic shield (ESS) to
ensure a purely inductive plasma coupling
without a capacitive component.
Therefore contamination by wall sputtering
and ion induced substrate damage is excluded.
Source to Substrate distance
This distance can be varied over a wide
range for optimal process control.
With kind permission of
Technische Universität Darmstadt - Optische Nachrichtentechnik,
Prof. Dr. Meissner and
Walter Schottky Institut - Technsiche Universität München,
Prof. Dr. Amann cooperating within EU-project “Subtune” No.
224259 |
DBR Optimisation:
The stress, refractive index und thickness of the films are varied by
changing the process parameters like the pressure. Then the reflection
& transmission of DBR consisting of SiN / SiO multilayers is measured.

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