Technology:
Reactive Ion Etching
with ICP Source
Inductive Coupled Plasma
Chlorine based Process
RF driven substrate electrode
Results:
rate : 0.3 - 0.8 µm/ min
up to 2 µm/ min for GaP/InGaAlP/GaAs depending on multilayer composition
selectivity to SiO2 mask ca 10 : 1
good uniformity
very anisotropic etch
smooth walls |
OPT application lab:
20 µm deep GaP/ InGaAlP/ GaAs etch
target angle was 45° |
Inductive Coupled Plasma Etching |