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Plasma Technology |
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temperature controlled vapour draw dose control by fast pulse ALD valve deposition temperature: 50° - 200° C cycle time 4 sec resistivity 5 x E-3 ohm cm C impurity < 2 at % at 150° C uniformity: ± 1% (100 mm) repeatability: ± 1% refractive index: 1.90 - 1.95 Zn:O 1:1
GRC vs deposition (table) temperature |
Growth rate per cycle and refractive index
ALD schematic
AES analysis shows Zn:O 1:1 and C < 2 at % |
"Flex AL" for
"OpAL" for |